2024年11月18-21日，第十屆國(guó)際第三代半導(dǎo)體論壇（IFWS2024）&第二十一屆中國(guó)國(guó)際半導(dǎo)體照明論壇（SSLCHINA2024）、先進(jìn)半導(dǎo)體技術(shù)應(yīng)用創(chuàng)新展（CASTAS）將在蘇州國(guó)際博覽中心G館舉辦。

蘇州聯(lián)訊儀器股份有限公司將攜多款產(chǎn)品亮相此次展會(huì)。值此，誠(chéng)摯邀請(qǐng)第三代半導(dǎo)體產(chǎn)業(yè)同仁共聚論壇，蒞臨?A24號(hào)展位參觀交流、洽談合作。

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關(guān)于聯(lián)訊儀器

聯(lián)訊儀器位于蘇州高新區(qū)湘江路1508號(hào)，是國(guó)內(nèi)領(lǐng)先的高端測(cè)試儀器和設(shè)備供應(yīng)商，主要專注于光網(wǎng)絡(luò)測(cè)試、光芯片測(cè)試、電性能測(cè)試和功率芯片測(cè)試。公司可以提供包括寬帶采樣示波器、高速誤碼儀、網(wǎng)絡(luò)流量測(cè)試儀、高精度快速波長(zhǎng)計(jì)、精密數(shù)字源表、低泄漏矩陣開(kāi)關(guān)等高端測(cè)試儀器，以及高速光電混合ATE、半導(dǎo)體激光器CoC老化、裸Die芯片測(cè)試、硅光晶圓測(cè)試、SiC晶圓老化、SiC裸Die 功率芯片KGD測(cè)試分選、WAT晶圓允收測(cè)試系統(tǒng)、WLR/PLR可靠性測(cè)試系統(tǒng)等高端測(cè)試設(shè)備。?

公司研發(fā)實(shí)力雄厚，建設(shè)有江蘇省企業(yè)工程技術(shù)研究中心（省級(jí)企業(yè)技術(shù)中心），并與南京大學(xué)、上海交通大學(xué)、南京先進(jìn)激光技術(shù)研究院、東南大學(xué)、寧波大學(xué)高等技術(shù)研究院長(zhǎng)期開(kāi)展產(chǎn)學(xué)研合作，與中國(guó)科學(xué)院微電子研究所蘇州產(chǎn)業(yè)技術(shù)研究院共同建立聯(lián)合實(shí)驗(yàn)室。擁有一支專注于高端光電測(cè)試測(cè)量?jī)x器行業(yè)，具備豐富生產(chǎn)管理、技術(shù)研發(fā)的高素質(zhì)科研團(tuán)隊(duì)，為公司各類測(cè)試裝備的研發(fā)、生產(chǎn)提供技術(shù)支持。公司目前擁有國(guó)家專利275項(xiàng)，其中發(fā)明專利95項(xiàng)。?

請(qǐng)瀏覽我們的網(wǎng)站www.semight.com，了解聯(lián)訊儀器更多信息。

COMPANY PROFILE?

Semight is a leading provider of global high-end testing instrument and equipment. Our company supports a wide range of products covering fields from R&D to high volume manufacturing in optical network test, optical chip test, electronic measurement and power semiconductor test.?

Semight’s testing instruments include High-Speed Bit Error Ratio Tester, Network Traffic Analyzer, Broadband Sampling Oscilloscope, High-Precision Wavelength Meter and Digital Source Measure Unit. In addition, our company delivers Optoelectronic Hybrid ATE, Laser Chip Burn-in System, Laser Chip Tester, Silicon Photonics Wafer Tester, Power Chip Tester, Wafer Level Burn-In System and Wafer Level Reliability Test System to global customers.

?Our company has strong research and development (R&D) strength. We have built a Jiangsu Enterprise Engineering Technology Research Center (provincial enterprise technology center), and has long-term academic-research cooperation with Nanjing University, Shanghai Jiaotong University, Nanjing Advanced Laser Technology Research Institute, Southeast University and The Research Institute of Advanced Technology, Ningbo University.??

Please visit our website at: www.semight.com.

about Products/產(chǎn)品介紹：?

晶圓級(jí)老化系統(tǒng) WLBI3800

Wafer Level Burn-In System ?WLBI3800

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WLBI3800晶圓級(jí)老化系統(tǒng)是一款高端專業(yè)的碳化硅晶圓老化測(cè)試設(shè)備，能夠同時(shí)對(duì)3片晶圓進(jìn)行高溫柵極偏壓(HTGB)老化和高溫反向偏壓(HTRB)老化，老化測(cè)試時(shí)間范圍廣泛，從數(shù)分鐘到數(shù)十小時(shí)，甚至可擴(kuò)展至數(shù)千小時(shí)，可滿足不同產(chǎn)品的老化需求。設(shè)備集成自動(dòng)上料和下料系統(tǒng)，雙卡塞設(shè)計(jì)支持無(wú)縫切換，具備自動(dòng)切換老化條件功能，可以對(duì)每個(gè)Die的閾值電壓(Vth)進(jìn)行精確檢測(cè)；系統(tǒng)的每個(gè)通道具備獨(dú)立的過(guò)電流保護(hù)功能，可確保被測(cè)器件的安全；系統(tǒng)能夠生成Map數(shù)據(jù)，以便用戶進(jìn)行深入的性能分析和質(zhì)量控制。系統(tǒng)能夠?yàn)榕可a(chǎn)提供穩(wěn)定可靠的老化測(cè)試支持，也可為研發(fā)應(yīng)用提供靈活的可配置選項(xiàng)。

WLBI3800 is a professional silicon carbide wafer burn-in test equipment. It can simultaneously performing HTGB burn-in and HTRB burn-in on three wafers. The burn-in test time range is extensive, spinning from a few minutes to thousands of hours, meeting the burn-in requirements of various products. The equipment integrates an automatic loading and unloading system with dual cassette design. It features automatic switching of burn-in conditions and can precisely detect the threshold voltage (Vth) of each die. Each channel of the system has independent overcurrent protection to ensure the safety of the tested devices.?

特點(diǎn)：?

1.支持晶圓的全自動(dòng)上料和下料，減少人工干預(yù)，提高老化效率和準(zhǔn)確性?

2.高精度定位，針痕重復(fù)定位精度達(dá)到±25μm?

3.系統(tǒng)功能豐富：支持Map數(shù)據(jù)綁定，支持高密度探針卡以及高壓Chuck，最高可支持一次同時(shí)老化2112個(gè)Die?

4.多模式老化：HTGB與HTRB自動(dòng)可切換，滿足不同老化需求?

5.漏電配置掃描：Igss與Idss漏電配置可掃描?

6.集成測(cè)試功能：集成Vth參數(shù)測(cè)試，

7.高精度漏電流測(cè)試：最高精度漏電流分辨率可以達(dá)到0.1nA?

8.溫度控制：溫度均勻性≤±3℃，準(zhǔn)確性≤1℃，分辨率0.1℃?

1.Automated Loading and Unloading: Automatically switche between HTGB and HTRB?

2.High Precision Positioning: Probe mark repositioning accuracy reaches ±25μm?

3.Data Traceability: Support map data binding for tracing and recording each test data?

4.Burn-in plans can be flexibly configured to meet varying wafer burn-in requirements?

5.High Precision Leakage Current Testing: Maximum precision leakage current resolution up to 0.1nA?

6.Multi-Mode Burn in: Automatically switches between HTGB and HTRB?

7.Integrated Testing Functions: Integrates Vth parameter testing. Support high-density probe cards and high-voltage chucks. Support up to 2112 dies simultaneously?

8.Temperature Control: Temperature uniformity ≤±3℃, accuracy ≤1℃, and resolution of 0.1℃

參會(huì)聯(lián)系

今年，第十屆國(guó)際第三代半導(dǎo)體論壇&第二十一屆中國(guó)國(guó)際半導(dǎo)體照明論壇（IFWS＆SSLCHINA2024）將于11月18-21日在蘇州國(guó)際博覽中心舉辦，國(guó)內(nèi)外院士專家齊聚，數(shù)十場(chǎng)會(huì)議活動(dòng)，數(shù)百位報(bào)告嘉賓，全產(chǎn)業(yè)鏈知名企業(yè)參與&參展，內(nèi)容全面覆蓋行業(yè)工藝裝備、原材料、技術(shù)、產(chǎn)品與應(yīng)用各環(huán)節(jié)，融合聚集產(chǎn)、學(xué)、研、用、政、金多個(gè)層面的資源，年度國(guó)際第三代半導(dǎo)體產(chǎn)業(yè)“風(fēng)向標(biāo)”盛會(huì)，11月相聚蘇州，共襄盛會(huì)，共謀發(fā)展！歡迎業(yè)界同仁咨詢參展參會(huì)，免費(fèi)觀展交流合作！》》》最新60+報(bào)告嘉賓公布！IFWS&SSLCHINA2024報(bào)名中！